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k-Space Associates, Inc.
in Surface Analysis Services, Thickness Monitors / Measurement, Wafer Inspection, Film Thickness Measurement Devices, Thin Film Coating, Research & Development, Installation & Testing Services, Surface Analysis Equipment, Automation Equipment, Process Controllers / Monitors
The leading metrology supplier of instrumentation and software for research and production facilities. Its systems are used for real-time monitoring of thin-film temperature, stress, deposition rate, thickness, analytical RHEED, and more.
2182 Bishop Circle East
Dexter, Michigan
48130
United States of America
Kratos Analytical
in Surface Analysis Services, Materials Testing, Film Thickness Measurement Devices, Analytical Services, Surface Analysis Equipment, Turbomolecular Pumping Systems, Sputter Cleaning/Depth Profiling
For over 5 decades Kratos Analytical has provided state-of-the-art spectrometers for both surface and biochemical analysis and we are committed to continuing with development of leading technologies.
404 East Route 59
Nanuet, New York
10954
United States of America
Ionoptika Ltd
in Ion Milling Equipment / Services, Surface Analysis Equipment, Ion Beam Deposition Systems / Guns
We offer a range of high performance ion beam systems and accessories serving surface analysts in industry and research establishments.
Unit B6. Millbrook Close
Hampshire
SO53 4BZ
United Kingdom
ION-TOF USA, Inc.
in Surface Analysis Services, Consulting, Surface Analysis Equipment
A world leader in Innovative Surface Analysis. Supplier of TOF-SIMS and Ion Scattering systems. Through our NanoScan subsidiary we also supply Magnetic Force Microscopes.
100 Red Schoolhouse Road
Ste. A8
Chestnut Ridge, New York
10977
United States of America
LK Technologies
in Vacuum Chambers, Vacuum System Accessories, Surface Analysis Equipment, Ion Beam Deposition Systems / Guns
LK Technologies engineers and manufactures precision surface science equipment & surface analysis equipment including complete systems.
1590 S. Liberty Drive
Suite A
Bloomington, Indiana
47403
United States of America
812-332-4449
Fax: 812-332-4493
Teledyne Princeton Instruments
3660 Quakerbridge Road
Trenton, New Jersey
08619
United States of America
LayTec AG
in Film Thickness Measurement Devices, Surface Analysis Equipment
Seesener Str. 10-13 BERLIN
Semilab USA LLC.
in Thickness Monitors / Measurement, Materials Testing, Film Thickness Measurement Devices, Plasma Enhanced Chemical Vapor Deposition - PECVD, Research & Development, Physical Vapor Deposition - PVD, Surface Analysis Equipment, Atomic Force Microscopy (AFM)
101 Billerica Ave
Bldg 5, Suite 105
North Billerica, Massachusetts
1862
United States of America
TrueGage
1008 Wedgewood Drive
Jeannette, PA
15644
United States
OAI
in Repair Services, Calibration Services, Surface Analysis Equipment, Adhesives
685 River Oaks Parkway
San Jose, California
95134
United States of America