ION-TOF USA, Inc.


About

Innovative Instrumentation for Surface Analysis

IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time of flight secondary ion mass spectrometry (TOF SIMS), high sensitivity low energy ion scattering (LEIS), and scanning probe microscopy (SPM).

M6, the ultimate SIMS Machine

2019 saw the introduction of our new state-of-the-art TOF-SIMS instrument, the M6 . The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyzer technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. With the new ToF MS/MS option IONTOF also offers now a cost-effective MS/MS solution for the M6. The option is ideally suited for quick confirmation of anticipated contaminants or compositions and fast MS/MS imaging or depth profiling applications. With the unique high mass resolution precursor selection system, it is possible to generate individual MS2 spectra of different molecules from the same nominal mass while avoiding fragmentation pattern interferences.

True 3D Nano Characterization

In addition to the standard M6 instrument IONTOF also offers with the M6 Plus, which combines Scanning Probe Microscopy (SPM) with TOF-SIMS, the ideal tool for chemical nano characterization. Through the combination of these two techniques true in situ three-dimensional chemical imaging becomes possible.

High Performance Mass Spectrometry

The M6 Hybird SIMS integrates the Thermo ScientificTM OrbitrapTM mass analyzer in to the system. This allows SIMS analyses with mass resolutions over 240,000, mass accuracies less than 1ppm and full MS/MS capability. Ideal for biological analyses, where such high mass resolutions are critical in peak identification, this new instrument is truly breaking new ground in the field of high-performance SIMS mass spectrometry.

Top Atomic Layer Characterization

The Qtac100 is a high sensitivity Low Energy Ion Scattering system for true atomic layer characterization. Ideally suited to the analysis of ALD films, catalysts, fuel cells and battery materials the Qtac 100 is the perfect choice for ultimate surface sensitivity applications.

High Performance MFM

Magnetic Force Microscopy has been at the heart of NanoScan for many years and with the introduction of the VLS-80 the ultimate MFM resolution is now available for large samples in an easy to operate system.

Contact

100 Red Schoolhouse Road
Bldg. A8
Chestnut Ridge, New York 10977
United States of America

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Features

  • 2019 AVS Corporate Member