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k-Space Associates, Inc.
in Surface Analysis Services, Thickness Monitors / Measurement, Wafer Inspection, Film Thickness Measurement Devices, Thin Film Coating, Research & Development, Installation & Testing Services, Surface Analysis Equipment, Automation Equipment, Process Controllers / Monitors
The leading metrology supplier of instrumentation and software for research and production facilities. Its systems are used for real-time monitoring of thin-film temperature, stress, deposition rate, thickness, analytical RHEED, and more.
2182 Bishop Circle East
Dexter, Michigan
48130
United States of America
LK Technologies
in Vacuum Chambers, Vacuum System Accessories, Surface Analysis Equipment, Ion Beam Deposition Systems / Guns
LK Technologies engineers and manufactures precision surface scienceequipment & surface analysis equipment including complete systems.
1590 S. Liberty Drive
Suite A
Bloomington, Indiana
47403
United States of America
812-332-4449
Fax: 812-332-4493
Ionoptika Ltd
in Ion Milling Equipment / Services, Surface Analysis Equipment, Ion Beam Deposition Systems / Guns
We offer a range of high performance ion beam systems and accessories serving surface analysts in industry and research establishments.
Unit B6. Millbrook Close
Hampshire
SO53 4BZ
United Kingdom
ION-TOF USA, Inc.
in Surface Analysis Services, Consulting, Surface Analysis Equipment
A world leader in Innovative Surface Analysis. Supplier of TOF-SIMS and Ion Scattering systems. Through our NanoScan subsidiary we also supply Magnetic Force Microscopes.
100 Red Schoolhouse Road
Bldg. A8
Chestnut Ridge, New York
10977
United States of America
Kratos Analytical
in Surface Analysis Services, Materials Testing, Film Thickness Measurement Devices, Analytical Services, Surface Analysis Equipment, Turbomolecular Pumping Systems, Sputter Cleaning/Depth Profiling
For over 5 decades Kratos Analytical has provided state-of-the-art spectrometers for both surface and biochemical analysis and we are committed to continuing with development of leading technologies.
100 Red School House Road
Building A
Spring Valley, New York
10977
United States of America
Asylum Research an Oxford Instruments Company
6310 Hollister Avenue Santa Barbara
California
93117
United States of America
Semilab USA LLC.
in Thickness Monitors / Measurement, Materials Testing, Film Thickness Measurement Devices, Plasma Enhanced Chemical Vapor Deposition - PECVD, Research & Development, Physical Vapor Deposition - PVD, Surface Analysis Equipment, Atomic Force Microscopy (AFM)
101 Billerica Ave
Bldg 5, Suite 105
North Billerica, Massachusetts
1862
United States of America
Nonsequitur Technologies
in Filaments, Surface Analysis Equipment, Gas Control Systems / Panels
20664 Carmen Loop #3
Bend, Oregon
97702
United States of America
CEMECON AG
in Plasma Enhanced Chemical Vapor Deposition - PECVD, Sputtering Deposition, Research & Development, Physical Vapor Deposition - PVD, Surface Analysis Equipment
Adenauerstrasse 20A4 52146
Princeton Research Instruments
PO Box 1174 Princeton
New Jersey
8542
United States of America