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k-Space Associates, Inc.
in Surface Analysis Services, Thickness Monitors / Measurement, Wafer Inspection, Film Thickness Measurement Devices, Thin Film Coating, Research & Development, Installation & Testing Services, Surface Analysis Equipment, Automation Equipment, Process Controllers / Monitors
The leading metrology supplier of instrumentation and software for research and production facilities. Its systems are used for real-time monitoring of thin-film temperature, stress, deposition rate, thickness, analytical RHEED, and more.
2182 Bishop Circle East
Dexter, Michigan
48130
United States of America
Kratos Analytical
in Surface Analysis Services, Materials Testing, Film Thickness Measurement Devices, Analytical Services, Surface Analysis Equipment, Turbomolecular Pumping Systems, Sputter Cleaning/Depth Profiling
For over 5 decades Kratos Analytical has provided state-of-the-art spectrometers for both surface and biochemical analysis and we are committed to continuing with development of leading technologies.
100 Red School House Road
Building A
Spring Valley, New York
10977
United States of America
ION-TOF USA, Inc.
in Surface Analysis Services, Consulting, Surface Analysis Equipment
A world leader in Innovative Surface Analysis. Supplier of TOF-SIMS and Ion Scattering systems. Through our NanoScan subsidiary we also supply Magnetic Force Microscopes.
100 Red Schoolhouse Road
Bldg. A8
Chestnut Ridge, New York
10977
United States of America
Anderson Materials Evaluation, Inc.
in Surface Analysis Services, Materials Testing, Contamination Management Solutions, Analytical Services, Research & Development
Anderson Materials Evaluation offers materials analysis and testing, failure analysis, quality control, and materials and process R&D, XPS, GCMS, FTIR, TGA, DSC, TMA, UV-Vis, SEM/EDS, mechanical testing, corrosion, adhesive bonding, contamination
9051 Red Branch Rd.
Suite C
Columbia, Maryland
21045
United States of America
410-740-8562
Fax: 410-740-8201
Ambios Technology, Inc.
in Surface Analysis Services, Thickness Monitors / Measurement, Wafer Inspection, Materials Testing, Film Thickness Measurement Devices
100 Pioneer Street Suite A
Santa Cruz, California
95060
United States of America
Bruker Optics Inc.
in Surface Analysis Services, Thickness Monitors / Measurement, Analytical Services, Particle Monitoring, Surface Analysis Equipment, Atomic Force Microscopy (AFM)
19 Fortune Drive
Billerica, Massachusetts
01821-3991
United States of America
ChemTrace
in Surface Analysis Services, Wafer Inspection, Materials Testing, Contamination Management Solutions, Analytical Services
44050 Fremont Blvd
Fremont, California
94538
United States of America
DataPhysics Instruments GmbH
Raiffeisenstrasse 34
70794 Filderstadt
Germany
Oxford Instruments Magnetic Resonance
in Surface Analysis Services, Magnet and Magnetic Technology, Cryogenic Equipment, Thermocouples, Gas Analyzer
Tubney Woods Abingdon
Oxfordshire
OX13 5QX
United Kingdom
Oxford Instruments, Omicron-Nano Science
in Surface Analysis Services, Film Thickness Measurement Devices, Sputtering, Evaporation Systems, Deposition Fixtures
14850 Scenic Heights Road Suite 140
Eden Prarie, Minnesota
55344-2243
United States of America